Noncontact Lasercheck technology performs in-process roughness measurements in micron, microinch, RMS, or Ra
Offers full scanning capabilities for education and routine applications
Validates parts rolling depth and stress relief
One-third the size, one-third the energy use
Highly accurate, easy to install, and maintenance-free
Beam irradiance imaged by remote camera and analyzed
Combines wavelength-dispersive X-ray fluorescence with optical emission spectrometry
Faster frame rates, reduced noise for USB 2.0 models
Nanometer-level motion analysis for calibration, error-mapping, and compensation
Company to focus on process equipment for the LED, solar, and data storage markets
Laser power detector reflects almost no light across the visible part of the infrared spectrum
Automatically creates a ballooned inspection sheet and inspection reports for AS9102
Supports all fieldbus devices in many environments
Synchrotron-like results now attainable in the laboratory
Manipulate, calibrate, label, and share uncompressed, high-resolution images or videos
New semiconductor laser suitable for security screening, drug quality control, and materials testing
Supports GigE communication and 1-D barcode reading
Millions of point, line, and polygon elements create inventory of ground features
Oct. 27–29 in Santiago de Queretaro, Mexico
Attend Master3DGage demo or take half-off on Verisurf X Software Suite
